Other Instruments

Powder Characterization

  • Helium pycnometer
  • Atomic force microscope (AFM)
  • Particle size analyzer
  • Scanning electron microscope (SEM)
  • Environmental SEM
  • X-Ray micro-tomography (micro-CT)
  • Zygo optical profilometer/Tencor stylus profilometer
  • Gas sorptometer (ASAP 2000)
  • Contact Angle Goniometer

Solid-State Characterization

  • X-ray diffractometry (powder and single crystal) with temperature control 
  • Moisture sorption apparatus
  • Thermo-gravimetry analyzer (TGA)
  • Differential scanning calorimeter (DSC)
  • Thermal mechanical analyzer (TMA)
  • Transmission electron microscope (TEM)
  • X-ray Photoelectron Spectroscopy (XPS)
  • Rotating disc dissolution rate apparatus (RDDR)
  • FTIR and Raman spectroscopy

Processing Equipment

  • Lab scale spray-drier
  • Crystallizer (1 liter)
  • Lab-scale micronizer (Jet-mill)
  • PK blender
  • High shear granulator (1L, custom made; RotoLab, 1.8L)
  • Turbula mixer (Model T2F)
  • Comil (Model U5, underdriven)

Modeling

  • Materials Studio & Cambridge Crystal Database (supported by Minnesota Supercomputing Institute)